PMID- 15613759
OWN - NLM
STAT- PubMed-not-MEDLINE
DCOM- 20050301
LR  - 20041222
IS  - 0108-7673 (Print)
IS  - 0108-7673 (Linking)
VI  - 61
IP  - Pt 1
DP  - 2005 Jan
TI  - Anomalous scattering method in crystallography on the basis of parametric 
      X-radiation.
PG  - 125-33
AB  - Spectra of parametric X-radiation (PXR) in the range of anomalous dispersion of 
      atoms of a crystallographic unit cell are theoretically analyzed. Characteristics 
      of PXR are calculated for both ultrarelativistic (E > or = 50 MeV) and 
      non-relativistic (E approximately 100 keV) electrons interacting with complex 
      organic crystals. The analysis of the PXR angular distribution is shown to permit 
      the realization of the anomalous scattering method for the direct measurement of 
      structure amplitude phases.
FAU - Feranchuk, I D
AU  - Feranchuk ID
AD  - Byelorussian State University, F. Skariny Av., 4, 220050 Minsk, Republic of 
      Belarus.
LA  - eng
PT  - Journal Article
DEP - 20041222
PL  - United States
TA  - Acta Crystallogr A
JT  - Acta crystallographica. Section A, Foundations of crystallography
JID - 8305825
EDAT- 2004/12/23 09:00
MHDA- 2004/12/23 09:01
CRDT- 2004/12/23 09:00
PHST- 2004/07/23 00:00 [received]
PHST- 2004/10/11 00:00 [accepted]
PHST- 2004/12/23 09:00 [pubmed]
PHST- 2004/12/23 09:01 [medline]
PHST- 2004/12/23 09:00 [entrez]
AID - S0108767304025607 [pii]
AID - 10.1107/S0108767304025607 [doi]
PST - ppublish
SO  - Acta Crystallogr A. 2005 Jan;61(Pt 1):125-33. doi: 10.1107/S0108767304025607. 
      Epub 2004 Dec 22.