PMID- 16756701
OWN - NLM
STAT- MEDLINE
DCOM- 20070711
LR  - 20191210
IS  - 0003-7028 (Print)
IS  - 0003-7028 (Linking)
VI  - 60
IP  - 5
DP  - 2006 May
TI  - Light profile microscopy based on Raman and wavelength resolved luminescence 
      contrast.
PG  - 503-15
AB  - Light profile microscopy based on contrast from wavelength resolved Raman and 
      luminescence measurements is demonstrated experimentally for the first time. A 
      Raman/multispectral light profile microscope (RMSLPM) has been constructed based 
      on a line profiling geometry in which the sample is irradiated with a tightly 
      focused laser beam (of ten micrometers radius or less) behind a polished view 
      surface and the resulting line image is dispersed over the wavelength using an 
      imaging spectrograph. The instrumentation developed in this laboratory has a 
      spectral resolution approaching 10 cm(-1) and an (actual) depth independent 
      spatial resolution of 6-8 times the Rayleigh diffraction limit, limited at 
      present by optical aberrations and alignment. The technique has the potential to 
      image at approximately twice the Rayleigh diffraction limit. The spectral 
      signatures reconstructed from a variety of common industrial polymers show 
      excellent agreement with reference spectra from the literature, and may be used 
      to identify individual layers in depth images of unknown materials. RMS-LPM image 
      data based on luminescence contrast have also been used to provide concentration 
      depth profiles of additives and degradation products in injection molded samples 
      of high-density poly(ethylene) (HDPE).
FAU - Power, J F
AU  - Power JF
AD  - Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, 
      Quebec, H3A 2K6 Canada. joan.power@mcgill.ca
FAU - Fu, S W
AU  - Fu SW
LA  - eng
PT  - Evaluation Study
PT  - Journal Article
PL  - United States
TA  - Appl Spectrosc
JT  - Applied spectroscopy
JID - 0372406
SB  - IM
MH  - Equipment Design
MH  - Equipment Failure Analysis
MH  - Luminescent Measurements/*instrumentation/methods
MH  - Microscopy, Confocal/*instrumentation/methods
MH  - Reproducibility of Results
MH  - Sensitivity and Specificity
MH  - Spectrum Analysis, Raman/*instrumentation/methods
MH  - Systems Integration
EDAT- 2006/06/08 09:00
MHDA- 2007/07/12 09:00
CRDT- 2006/06/08 09:00
PHST- 2006/06/08 09:00 [pubmed]
PHST- 2007/07/12 09:00 [medline]
PHST- 2006/06/08 09:00 [entrez]
AID - 10.1366/000370206777412112 [doi]
PST - ppublish
SO  - Appl Spectrosc. 2006 May;60(5):503-15. doi: 10.1366/000370206777412112.