PMID- 17097886
OWN - NLM
STAT- PubMed-not-MEDLINE
DCOM- 20070504
LR  - 20181113
IS  - 1044-0305 (Print)
IS  - 1044-0305 (Linking)
VI  - 18
IP  - 3
DP  - 2007 Mar
TI  - In situ temperature-time effect on MetA-S-SIMS.
PG  - 382-4
AB  - Metal-assisted (MetA) static secondary ion mass spectrometry (S-SIMS) is one of 
      several ion yield enhancing methods developed for S-SIMS in the last decades. 
      MetA-S-SIMS uses a very thin coating of gold or silver on the sample. Earlier 
      experiments revealed dependence of the ion yield enhancement on the applied 
      metal, the nature of the studied sample, the time after metallization, and the 
      heating temperature (ex situ, i.e., under atmospheric pressure). This paper 
      reports on the effects of time and temperature when samples are heated to 
      temperatures between 30 and 80 degrees C inside the S-SIMS vacuum chamber (in 
      situ). Thick layers of poly(vinylbutyral-co-vinylalcohol-co-vinylacetate) (PVB) 
      containing dihydroxybenzophenone (DHBPh) were coated with a nm-thin-layer of 
      gold. The S-SIMS analysis was performed over a period of several hours while 
      samples were kept at a constant elevated temperature. Compared to ex situ heating 
      in an oven, heating in the analysis chamber provided more rapid signal 
      enhancement, but the magnitude of the enhancement was less (by a factor of two). 
      Furthermore, additional experiments on ex situ heated samples revealed that 
      storage of samples with enhanced ion yields at -8 degrees C is not sufficient to 
      "stabilize" the enhancement. A steep decrease of the ion yields was observed as a 
      function of time after 2.5 h.
FAU - De Mondt, Roel
AU  - De Mondt R
AD  - Department of Chemistry, University of Antwerp, Wilrijk, Belgium. 
      roel.demondt@ua.ac.be
FAU - Van Vaeck, Luc
AU  - Van Vaeck L
FAU - Lenaerts, Jens
AU  - Lenaerts J
LA  - eng
PT  - Journal Article
DEP - 20061113
PL  - United States
TA  - J Am Soc Mass Spectrom
JT  - Journal of the American Society for Mass Spectrometry
JID - 9010412
EDAT- 2006/11/14 09:00
MHDA- 2006/11/14 09:01
CRDT- 2006/11/14 09:00
PHST- 2006/04/21 00:00 [received]
PHST- 2006/08/30 00:00 [revised]
PHST- 2006/09/30 00:00 [accepted]
PHST- 2006/11/14 09:00 [pubmed]
PHST- 2006/11/14 09:01 [medline]
PHST- 2006/11/14 09:00 [entrez]
AID - S1044-0305(06)00879-8 [pii]
AID - 10.1016/j.jasms.2006.09.029 [doi]
PST - ppublish
SO  - J Am Soc Mass Spectrom. 2007 Mar;18(3):382-4. doi: 10.1016/j.jasms.2006.09.029. 
      Epub 2006 Nov 13.