PMID- 19566205
OWN - NLM
STAT- PubMed-not-MEDLINE
DCOM- 20090902
LR  - 20090701
IS  - 1089-7623 (Electronic)
IS  - 0034-6748 (Linking)
VI  - 80
IP  - 6
DP  - 2009 Jun
TI  - A passive long-wavelength infrared microscope with a highly sensitive 
      phototransistor.
PG  - 063702
LID - 10.1063/1.3152224 [doi]
AB  - A passive scanning confocal microscope in the long-wavelength infrared (LWIR) 
      region has been developed for sensitive imaging of spontaneous LWIR radiation by 
      utilizing an ultrahighly sensitive detector, called the charge-sensitive infrared 
      phototransistor (CSIP). The microscope consisted of room-temperature components 
      including a Ge objective lens and liquid helium temperature components including 
      a confocal pinhole, Ge relay lenses, and CSIP detector. With the microscope, 
      thermal radiation (wavelength of 14.7 microm) spontaneously emitted by the object 
      was studied with a spatial resolution of 25 microm. Clear passive LWIR imaging 
      pictures were obtained by scanning a sample consisting of glass, Al foil, Ag 
      paste, and Au. Clear passive LWIR image was also obtained even when the sample 
      surface was covered by a GaAs or Si plate. This work suggests usefulness of CSIP 
      detectors for application of passive LWIR microscopy.
FAU - Kajihara, Yusuke
AU  - Kajihara Y
AD  - Department of Basic Science, The University of Tokyo, Komaba 3-8-1, Meguro-ku, 
      Tokyo 153-8902, Japan.
FAU - Komiyama, Susumu
AU  - Komiyama S
FAU - Nickels, Patrick
AU  - Nickels P
FAU - Ueda, Takeji
AU  - Ueda T
LA  - eng
PT  - Journal Article
PL  - United States
TA  - Rev Sci Instrum
JT  - The Review of scientific instruments
JID - 0405571
EDAT- 2009/07/02 09:00
MHDA- 2009/07/02 09:01
CRDT- 2009/07/02 09:00
PHST- 2009/07/02 09:00 [entrez]
PHST- 2009/07/02 09:00 [pubmed]
PHST- 2009/07/02 09:01 [medline]
AID - 10.1063/1.3152224 [doi]
PST - ppublish
SO  - Rev Sci Instrum. 2009 Jun;80(6):063702. doi: 10.1063/1.3152224.