PMID- 19946167 OWN - NLM STAT- PubMed-not-MEDLINE DCOM- 20100324 LR - 20091130 IS - 1361-6528 (Electronic) IS - 0957-4484 (Linking) VI - 21 IP - 1 DP - 2010 Jan 8 TI - Collapse behavior and forces of multistack nanolines. PG - 015708 LID - 10.1088/0957-4484/21/1/015708 [doi] AB - Two types of multistack nanolines (MNLs), Si-substrate (Si)/siliconoxynitride (SiON)/amorphous Si (a-Si)/ SiO(2) and Si/ SiO(2) /polycrystalline Si (poly-Si)/ SiO(2) were used to measure the collapse force and to investigate their collapse behavior by an atomic force microscope (AFM). The Si/SiON/a-Si/ SiO(2) MNL showed a larger length of fragment in the collapse patterns at a smaller collapse force. The Si/ SiO(2) /poly-Si/ SiO(2) MNL, however, demonstrated a smaller length of fragment at a higher applied collapse force. The collapse forces increased by the square of the linewidth in both Si/SiON/a-Si/ SiO(2) and Si/SiO(2) /poly-Si/ SiO(2) MNLs. Once an AFM tip touches an Si/SiON/a-Si/ SiO(2) line, which is a softer MNL, it was delaminated first at the Si/SiON interface. One end of the delaminated line was first broken and then the other end was bent until it was broken. A harder MNL, Si/ SiO(2) /poly-Si/ SiO(2), however, was broken at two ends simultaneously after the delamination occurred at the Si/ SiO(2) /poly-Si interface. The different collapse behaviors were attributed to the magnitude of adhesion forces at the stack material interfaces and the mechanical strength of MNLs. FAU - Kim, Tae-Gon AU - Kim TG AD - Department of Materials Engineering, Hanyang University, Ansan 426-791, Republic of Korea. FAU - Wostyn, Kurt AU - Wostyn K FAU - Mertens, Paul W AU - Mertens PW FAU - Busnaina, Ahmed A AU - Busnaina AA FAU - Park, Jin-Goo AU - Park JG LA - eng PT - Journal Article PT - Research Support, Non-U.S. Gov't DEP - 20091130 PL - England TA - Nanotechnology JT - Nanotechnology JID - 101241272 EDAT- 2009/12/01 06:00 MHDA- 2009/12/01 06:01 CRDT- 2009/12/01 06:00 PHST- 2009/12/01 06:00 [entrez] PHST- 2009/12/01 06:00 [pubmed] PHST- 2009/12/01 06:01 [medline] AID - S0957-4484(10)20641-4 [pii] AID - 10.1088/0957-4484/21/1/015708 [doi] PST - ppublish SO - Nanotechnology. 2010 Jan 8;21(1):015708. doi: 10.1088/0957-4484/21/1/015708. Epub 2009 Nov 30.