PMID- 20352813
OWN - NLM
STAT- PubMed-not-MEDLINE
DCOM- 20100506
LR  - 20190715
IS  - 1533-4880 (Print)
IS  - 1533-4880 (Linking)
VI  - 10
IP  - 1
DP  - 2010 Jan
TI  - High frequency properties of Fe-Si nano-powder/epoxy films.
PG  - 74-7
AB  - Composites of Fe93.5Si6.5 powder and epoxy (diglycidyl ether of bisphenol A type) 
      were prepared using an electron beam irradiation process. Scanning electron 
      microscope (SEM), vibrating sample magnetometer (VSM) and network analyzer were 
      used to analyze the structure, electromagnetic properties and micro wave 
      absorption of the composites. Results show that the saturation magnetization 
      depends on the fraction of the Fe93.5Si6.5 powder in the composite, which affects 
      initial permeability. It is believed that the eddy current loss is a dominant 
      factor over 1 GHz and that the resonance frequency of the composite decreases 
      with increasing fractions of Fe93.5Si6.5 powder. Finally, reflection loss was 
      calculated from the permeability and permittivity of these composites. Composite 
      with 50 wt% Fe93.5Si6.5 powder fractions and 5 mm thickness showed reflection 
      loss below -20 dB from 3.66 GHz to 4.16 GHz. Therefore, it is believed that thin 
      Fe-Si/epoxy composites may be a good candidate for microwave absorption 
      application.
FAU - Kim, Hyun-Bin
AU  - Kim HB
AD  - Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, 
      Jeongeup-si, Jeollabuk-do, 580-185, Korea.
FAU - Jeun, Joon-Pyo
AU  - Jeun JP
FAU - Hong, Seong-Min
AU  - Hong SM
FAU - Kang, Phil-Hyun
AU  - Kang PH
LA  - eng
PT  - Journal Article
PT  - Research Support, Non-U.S. Gov't
PL  - United States
TA  - J Nanosci Nanotechnol
JT  - Journal of nanoscience and nanotechnology
JID - 101088195
EDAT- 2010/04/01 06:00
MHDA- 2010/04/01 06:01
CRDT- 2010/04/01 06:00
PHST- 2010/04/01 06:00 [entrez]
PHST- 2010/04/01 06:00 [pubmed]
PHST- 2010/04/01 06:01 [medline]
AID - 10.1166/jnn.2010.1500 [doi]
PST - ppublish
SO  - J Nanosci Nanotechnol. 2010 Jan;10(1):74-7. doi: 10.1166/jnn.2010.1500.