PMID- 21411916
OWN - NLM
STAT- PubMed-not-MEDLINE
DCOM- 20110718
LR  - 20110317
IS  - 1361-6528 (Electronic)
IS  - 0957-4484 (Linking)
VI  - 22
IP  - 17
DP  - 2011 Apr 29
TI  - Fabrication and buckling dynamics of nanoneedle AFM probes.
PG  - 175303
LID - 10.1088/0957-4484/22/17/175303 [doi]
AB  - A new method for the fabrication of high-aspect-ratio probes by electron beam 
      induced deposition is described. This technique allows the fabrication of 
      cylindrical 'nanoneedle' structures on the atomic force microscope (AFM) probe 
      tip which can be used for accurate imaging of surfaces with high steep features. 
      Scanning electron microscope (SEM) imaging showed that needles with diameters in 
      the range of 18-100 nm could be obtained by this technique. The needles were 
      shown to undergo buckling deformation under large tip-sample forces. The 
      deformation was observed to recover elastically under vertical deformations of up 
      to  approximately  60% of the needle length, preventing damage to the needle. A technique of 
      stabilizing the needle against buckling by coating it with additional electron 
      beam deposited carbon was also investigated; it was shown that coated needles of 
      75 nm or greater total diameter did not buckle even under tip-sample forces of  approximately  
      1.5 microN.
FAU - Beard, J D
AU  - Beard JD
AD  - Department of Physics, University of Bath, Claverton Down, Bath BA2 7AY, UK.
FAU - Gordeev, S N
AU  - Gordeev SN
LA  - eng
PT  - Journal Article
DEP - 20110316
PL  - England
TA  - Nanotechnology
JT  - Nanotechnology
JID - 101241272
EDAT- 2011/03/18 06:00
MHDA- 2011/03/18 06:01
CRDT- 2011/03/18 06:00
PHST- 2011/03/18 06:00 [entrez]
PHST- 2011/03/18 06:00 [pubmed]
PHST- 2011/03/18 06:01 [medline]
AID - S0957-4484(11)76453-4 [pii]
AID - 10.1088/0957-4484/22/17/175303 [doi]
PST - ppublish
SO  - Nanotechnology. 2011 Apr 29;22(17):175303. doi: 10.1088/0957-4484/22/17/175303. 
      Epub 2011 Mar 16.