PMID- 22111808 OWN - NLM STAT- MEDLINE DCOM- 20120427 LR - 20200930 IS - 1530-6992 (Electronic) IS - 1530-6984 (Linking) VI - 12 IP - 1 DP - 2012 Jan 11 TI - Reconfigurable silicon nanowire transistors. PG - 119-24 LID - 10.1021/nl203094h [doi] AB - Over the past 30 years electronic applications have been dominated by complementary metal oxide semiconductor (CMOS) devices. These combine p- and n-type field effect transistors (FETs) to reduce static power consumption. However, CMOS transistors are limited to static electrical functions, i.e., electrical characteristics that cannot be changed. Here we present the concept and a demonstrator of a universal transistor that can be reversely configured as p-FET or n-FET simply by the application of an electric signal. This concept is enabled by employing an axial nanowire heterostructure (metal/intrinsic-silicon/metal) with independent gating of the Schottky junctions. In contrast to conventional FETs, charge carrier polarity and concentration are determined by selective and sensitive control of charge carrier injections at each Schottky junction, explicitly avoiding the use of dopants as shown by measurements and calculations. Besides the additional functionality, the fabricated nanoscale devices exhibit enhanced electrical characteristics, e.g., record on/off ratio of up to 1 x 10(9) for Schottky transistors. This novel nanotransistor technology makes way for a simple and compact hardware platform that can be flexibly reconfigured during operation to perform different logic computations yielding unprecedented circuit design flexibility. CI - (c) 2011 American Chemical Society FAU - Heinzig, Andre AU - Heinzig A AD - Namlab gGmbH, Nothnitzer Str. 64, 01187 Dresden, Germany. FAU - Slesazeck, Stefan AU - Slesazeck S FAU - Kreupl, Franz AU - Kreupl F FAU - Mikolajick, Thomas AU - Mikolajick T FAU - Weber, Walter M AU - Weber WM LA - eng PT - Journal Article PT - Research Support, Non-U.S. Gov't DEP - 20111201 PL - United States TA - Nano Lett JT - Nano letters JID - 101088070 RN - Z4152N8IUI (Silicon) SB - IM MH - Crystallization/*methods MH - Equipment Design MH - Equipment Failure Analysis MH - Nanostructures/*chemistry/*ultrastructure MH - Nanotechnology/*instrumentation MH - Particle Size MH - Silicon/*chemistry MH - *Transistors, Electronic EDAT- 2011/11/25 06:00 MHDA- 2012/04/28 06:00 CRDT- 2011/11/25 06:00 PHST- 2011/11/25 06:00 [entrez] PHST- 2011/11/25 06:00 [pubmed] PHST- 2012/04/28 06:00 [medline] AID - 10.1021/nl203094h [doi] PST - ppublish SO - Nano Lett. 2012 Jan 11;12(1):119-24. doi: 10.1021/nl203094h. Epub 2011 Dec 1.