PMID- 22724385
OWN - NLM
STAT- MEDLINE
DCOM- 20121130
LR  - 20120725
IS  - 1520-5827 (Electronic)
IS  - 0743-7463 (Linking)
VI  - 28
IP  - 29
DP  - 2012 Jul 24
TI  - Emerging techniques for submicrometer particle sizing applied to Stober silica.
PG  - 10860-72
LID - 10.1021/la301351k [doi]
AB  - The accurate characterization of submicrometer and nanometer sized particles 
      presents a major challenge in the diverse applications envisaged for them 
      including cosmetics, biosensors, renewable energy, and electronics. Size is one 
      of the principal parameters for classifying particles and understanding their 
      behavior, with other particle characteristics usually only quantifiable when size 
      is accounted for. We present a comparative study of emerging and established 
      techniques to size submicrometer particles, evaluating their sizing precision and 
      relative resolution, and demonstrating the variety of physical principles upon 
      which they are based, with the aim of developing a framework in which they can be 
      compared. We used in-house synthesized Stober silica particles between 100 and 
      400 nm in diameter as reference materials for this study. The emerging techniques 
      of scanning ion occlusion sensing (SIOS), differential centrifugal sedimentation 
      (DCS), and nanoparticle tracking analysis (NTA) were compared to the established 
      techniques of transmission electron microscopy (TEM), scanning mobility particle 
      sizing (SMPS), and dynamic light scattering (DLS). The size distributions were 
      described using the mode, arithmetic mean, and standard deviation. Uncertainties 
      associated with the six techniques were evaluated, including the statistical 
      uncertainties in the mean sizes measured by the single-particle counting 
      techniques. Q-Q plots were used to analyze the shapes of the size distributions. 
      Through the use of complementary techniques for particle sizing, a more complete 
      characterization of the particles was achieved, with additional information on 
      their density and porosity attained.
FAU - Bell, Nia C
AU  - Bell NC
AD  - Department of Materials, Imperial College London, London, SW7 2AZ, UK.
FAU - Minelli, Caterina
AU  - Minelli C
FAU - Tompkins, Jordan
AU  - Tompkins J
FAU - Stevens, Molly M
AU  - Stevens MM
FAU - Shard, Alexander G
AU  - Shard AG
LA  - eng
PT  - Journal Article
PT  - Research Support, Non-U.S. Gov't
DEP - 20120711
PL  - United States
TA  - Langmuir
JT  - Langmuir : the ACS journal of surfaces and colloids
JID - 9882736
RN  - 7631-86-9 (Silicon Dioxide)
SB  - IM
MH  - *Chemistry Techniques, Analytical
MH  - Nanoparticles/chemistry
MH  - *Nanotechnology
MH  - Particle Size
MH  - Silicon Dioxide/chemical synthesis/*chemistry
MH  - Surface Properties
EDAT- 2012/06/26 06:00
MHDA- 2012/12/10 06:00
CRDT- 2012/06/26 06:00
PHST- 2012/06/26 06:00 [entrez]
PHST- 2012/06/26 06:00 [pubmed]
PHST- 2012/12/10 06:00 [medline]
AID - 10.1021/la301351k [doi]
PST - ppublish
SO  - Langmuir. 2012 Jul 24;28(29):10860-72. doi: 10.1021/la301351k. Epub 2012 Jul 11.