PMID- 23650075 OWN - NLM STAT- PubMed-not-MEDLINE DCOM- 20140106 LR - 20130626 IS - 1097-0029 (Electronic) IS - 1059-910X (Linking) VI - 76 IP - 7 DP - 2013 Jul TI - Investigation on infrared laser desorption of solid matrix using scanning electron microscope and fast photography. PG - 744-50 LID - 10.1002/jemt.22225 [doi] AB - Infrared light from a pulsed optical parametric oscillator laser system was used to irradiate succinic acid (SA), a usual solid matrix used in matrix-assisted laser desorption ionization, under vacuum. Ablated SA particles were trapped using a silica plate mounted 3.0 mm above and parallel to the sample surface. The morphology and particle size of ablated particles at different laser fluences were investigated using a scanning electron microscope (SEM). The dynamics of plume propagation for SA desorption process was studied with fast photography at atmospheric pressure. Plume expanding at 1.12 J/cm(2) laser fluence was recorded using a high-speed CMOS camera and corresponding propagation distance was measured. The solid matrix desorption was driven by phase explosion according to plume model fitting, which was consistent with the results of SEM. CI - Copyright (c) 2013 Wiley Periodicals, Inc. FAU - Fan, Xing AU - Fan X AD - School of Chemical Engineering, China University of Mining and Technology, Xuzhou 221116, Jiangsu, People's Republic of China. fanxing@cumt.edu.cn FAU - Wang, Shou-Ze AU - Wang SZ FAU - Zheng, Ai-Li AU - Zheng AL FAU - Wei, Xian-Yong AU - Wei XY FAU - Zhao, Yun-Peng AU - Zhao YP FAU - Zong, Zhi-Min AU - Zong ZM FAU - Zhao, Wei AU - Zhao W LA - eng PT - Journal Article PT - Research Support, Non-U.S. Gov't DEP - 20130507 PL - United States TA - Microsc Res Tech JT - Microscopy research and technique JID - 9203012 EDAT- 2013/05/08 06:00 MHDA- 2013/05/08 06:01 CRDT- 2013/05/08 06:00 PHST- 2013/02/17 00:00 [received] PHST- 2013/03/18 00:00 [revised] PHST- 2013/04/06 00:00 [accepted] PHST- 2013/05/08 06:00 [entrez] PHST- 2013/05/08 06:00 [pubmed] PHST- 2013/05/08 06:01 [medline] AID - 10.1002/jemt.22225 [doi] PST - ppublish SO - Microsc Res Tech. 2013 Jul;76(7):744-50. doi: 10.1002/jemt.22225. Epub 2013 May 7.