PMID- 24100541
OWN - NLM
STAT- PubMed-not-MEDLINE
DCOM- 20140916
LR  - 20231110
IS  - 1460-4744 (Electronic)
IS  - 0306-0012 (Print)
IS  - 0306-0012 (Linking)
VI  - 43
IP  - 4
DP  - 2014 Feb 21
TI  - Tip-enhanced near-field optical microscopy.
PG  - 1248-62
LID - 10.1039/c3cs60258c [doi]
AB  - Tip-enhanced near-field optical microscopy (TENOM) is a scanning probe technique 
      capable of providing a broad range of spectroscopic information on single objects 
      and structured surfaces at nanometer spatial resolution and with highest 
      detection sensitivity. In this review, we first illustrate the physical principle 
      of TENOM that utilizes the antenna function of a sharp probe to efficiently 
      couple light to excitations on nanometer length scales. We then discuss the 
      antenna-induced enhancement of different optical sample responses including Raman 
      scattering, fluorescence, generation of photocurrent and electroluminescence. 
      Different experimental realizations are presented and several recent examples 
      that demonstrate the capabilities of the technique are reviewed.
FAU - Mauser, Nina
AU  - Mauser N
AD  - Department Chemie & CeNS, LMU Munchen, 81377 Munchen, Germany. 
      achim.hartschuh@lmu.de.
FAU - Hartschuh, Achim
AU  - Hartschuh A
LA  - eng
GR  - 279494/ERC_/European Research Council/International
PT  - Journal Article
PL  - England
TA  - Chem Soc Rev
JT  - Chemical Society reviews
JID - 0335405
PMC - PMC3907270
MID - EMS55204
OID - NLM: EMS55204
EDAT- 2013/10/09 06:00
MHDA- 2013/10/09 06:01
PMCR- 2014/02/21
CRDT- 2013/10/09 06:00
PHST- 2013/10/09 06:00 [entrez]
PHST- 2013/10/09 06:00 [pubmed]
PHST- 2013/10/09 06:01 [medline]
PHST- 2014/02/21 00:00 [pmc-release]
AID - 10.1039/c3cs60258c [doi]
PST - ppublish
SO  - Chem Soc Rev. 2014 Feb 21;43(4):1248-62. doi: 10.1039/c3cs60258c.