PMID- 24710465
OWN - NLM
STAT- PubMed-not-MEDLINE
DCOM- 20150521
LR  - 20140506
IS  - 1364-5528 (Electronic)
IS  - 0003-2654 (Linking)
VI  - 139
IP  - 11
DP  - 2014 Jun 7
TI  - Visualizing mass transport in desorption electrospray ionization using 
      time-of-flight secondary ion mass spectrometry.
PG  - 2668-73
LID - 10.1039/c4an00390j [doi]
AB  - Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to determine 
      the effect of ambient probe incidence angle on the amount and direction of 
      analyte molecules transported from the sample surface for desorption electrospray 
      ionization (DESI). Incidence angle was critical to both the lateral dispersion 
      and vertical take-off angles of analyte molecules desorbed from the surface; as 
      the incidence angle was increased from 30 degrees  to 45 degrees  to 60 degrees  (relative to the sample 
      surface), the lateral dispersion angle decreased from 79 degrees  to 71 degrees  to 62 degrees , 
      respectively, while the vertical take-off angle decreased dramatically from 12 degrees  
      to 6 degrees  to 4 degrees , respectively. As for the amount of material transported, the 
      ToF-SIMS normalized secondary ion intensity of the molecular ion (peak counts per 
      total spectrum counts) showed a significant decrease in the signal when the 
      incidence angle was made steeper, decreasing from 8.1 x 10(-3) to 4.2 x 10(-3) to 
      7.5 x 10(-4), respectively. The ambient mass spectrometer interfaced with DESI 
      also showed a similar analyte response, where the intensity of the molecular ion 
      decreased from 1.6 x 10(7) counts to 3.3 x 10(6) counts to 5.4 x 10(5) counts, 
      respectively. Overall, a steeper incidence angle was characterized by smaller 
      amount of material desorption and tighter dispersion in both lateral and vertical 
      directions. The study showed how ToF-SIMS can be used as a unique tool for 
      characterizing the transport of desorbed analyte molecules in ambient ionization 
      mass spectrometry, potentially offering new interface designs for optimal analyte 
      collection.
FAU - Muramoto, Shin
AU  - Muramoto S
AD  - National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. 
      shinichiro.muramoto@nist.gov.
FAU - Forbes, Thomas P
AU  - Forbes TP
FAU - Staymates, Matthew E
AU  - Staymates ME
FAU - Gillen, Greg
AU  - Gillen G
LA  - eng
PT  - Journal Article
PL  - England
TA  - Analyst
JT  - The Analyst
JID - 0372652
EDAT- 2014/04/09 06:00
MHDA- 2014/04/09 06:01
CRDT- 2014/04/09 06:00
PHST- 2014/04/09 06:00 [entrez]
PHST- 2014/04/09 06:00 [pubmed]
PHST- 2014/04/09 06:01 [medline]
AID - 10.1039/c4an00390j [doi]
PST - ppublish
SO  - Analyst. 2014 Jun 7;139(11):2668-73. doi: 10.1039/c4an00390j.