PMID- 24943109
OWN - NLM
STAT- PubMed-not-MEDLINE
DCOM- 20150330
LR  - 20140818
IS  - 1365-2818 (Electronic)
IS  - 0022-2720 (Linking)
VI  - 255
IP  - 2
DP  - 2014 Aug
TI  - Reversed scan direction reduces electron beam damage in EBSD maps.
PG  - 89-93
LID - 10.1111/jmi.12140 [doi]
AB  - The deleterious effects of electron beam damage on high-resolution electron 
      backscatter diffraction (EBSD) maps of undeformed quartz are significantly 
      reduced by scanning in the direction opposite to that dictated by widely used 
      EBSD acquisition software. Higher quality electron backscatter patterns are 
      produced when the electron beam moves progressively down the sample (the apparent 
      'up' direction in the resulting maps) for all step sizes where beam damage 
      affects EBSD map quality (</=  approximately 0.4 mum in this study). The relative improvement 
      associated with downward scanning increases as step size is reduced. A comparison 
      of high-resolution maps made in experimentally deformed quartz demonstrates that 
      downward scanning reduces by a factor of  approximately 2 the lower limit in step size relative 
      to maps scanned in the conventional direction. The electron beam damages quartz 
      at its point of entry, forming  approximately 0.1-mum diameter bumps visible in Scanning 
      electron microscope (SEM) images. Downward scanning produces better results 
      because it minimizes the flux of electrons through these loci of damaged crystal.
CI  - (c) 2014 The Authors Journal of Microscopy (c) 2014 Royal Microscopical Society.
FAU - Kidder, S
AU  - Kidder S
AD  - Department of Earth and Atmospheric Science, City College of New York, New York, 
      NY, U.S.A.
FAU - Prior, D
AU  - Prior D
LA  - eng
PT  - Journal Article
PT  - Research Support, U.S. Gov't, Non-P.H.S.
DEP - 20140618
PL  - England
TA  - J Microsc
JT  - Journal of microscopy
JID - 0204522
OTO - NOTNLM
OT  - Beam damage
OT  - EBSD
OT  - quartz
EDAT- 2014/06/20 06:00
MHDA- 2014/06/20 06:01
CRDT- 2014/06/20 06:00
PHST- 2014/01/28 00:00 [received]
PHST- 2014/04/26 00:00 [accepted]
PHST- 2014/06/20 06:00 [entrez]
PHST- 2014/06/20 06:00 [pubmed]
PHST- 2014/06/20 06:01 [medline]
AID - 10.1111/jmi.12140 [doi]
PST - ppublish
SO  - J Microsc. 2014 Aug;255(2):89-93. doi: 10.1111/jmi.12140. Epub 2014 Jun 18.