PMID- 25167845 OWN - NLM STAT- PubMed-not-MEDLINE DCOM- 20150521 LR - 20200930 IS - 1521-4095 (Electronic) IS - 0935-9648 (Linking) VI - 26 IP - 38 DP - 2014 Oct TI - Back gated multilayer InSe transistors with enhanced carrier mobilities via the suppression of carrier scattering from a dielectric interface. PG - 6587-93 LID - 10.1002/adma.201402427 [doi] AB - The back gate multilayer InSe FETs exhibit ultrahigh carrier mobilities, surpassing all the reported layer semiconductor based electronics with the same device configuration, which is achieved by the suppression of the carrier scattering from interfacial coulomb impurities or surface polar phonons at the interface of an oxidized dielectric substrate. The room-temperature mobilities of multilayer InSe transistors increase from 64 cm(2)V(-1)s(-1) to 1055 cm(2)V(-1)s(-1) using a bilayer dielectric of poly-(methyl methacrylate) (PMMA)/Al2O3. The transistors also have high current on/off ratios of 1 x 10(8), low standby power dissipation, and robust current saturation in a broad voltage range. CI - (c) 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. FAU - Feng, Wei AU - Feng W AD - State Key Laboratory of Robotics and System, Harbin Institute of Technology, Harbin, 150080, China; School of Materials Science and Engineering, Harbin Institute of Technology, Harbin, 150080, China. FAU - Zheng, Wei AU - Zheng W FAU - Cao, Wenwu AU - Cao W FAU - Hu, PingAn AU - Hu P LA - eng PT - Journal Article PT - Research Support, Non-U.S. Gov't DEP - 20140828 PL - Germany TA - Adv Mater JT - Advanced materials (Deerfield Beach, Fla.) JID - 9885358 OTO - NOTNLM OT - carrier scatter OT - field-effect transistor OT - indium selenide OT - mobility OT - two dimensional layer semiconductor EDAT- 2014/08/30 06:00 MHDA- 2014/08/30 06:01 CRDT- 2014/08/30 06:00 PHST- 2014/05/31 00:00 [received] PHST- 2014/07/07 00:00 [revised] PHST- 2014/08/30 06:00 [entrez] PHST- 2014/08/30 06:00 [pubmed] PHST- 2014/08/30 06:01 [medline] AID - 10.1002/adma.201402427 [doi] PST - ppublish SO - Adv Mater. 2014 Oct;26(38):6587-93. doi: 10.1002/adma.201402427. Epub 2014 Aug 28.