PMID- 25413988 OWN - NLM STAT- PubMed-not-MEDLINE DCOM- 20150521 LR - 20150226 IS - 1463-9084 (Electronic) IS - 1463-9076 (Linking) VI - 17 IP - 2 DP - 2015 Jan 14 TI - Complex behaviour of vacancy point-defects in SrRuO3 thin films. PG - 1060-9 LID - 10.1039/c4cp03632h [doi] AB - The behaviour of point defects in thin, epitaxial films of the oxide electrode SrRuO3 was probed by means of diffusion measurements. Thin-film SrRuO3 was deposited by means of pulsed laser deposition (PLD) on (100) oriented, undoped single crystal SrTiO3 substrates. (16)O/(18)O exchange anneals were employed to probe the behavior of oxygen vacancies. Anneals were performed in the temperature range 850