PMID- 25522868 OWN - NLM STAT- PubMed-not-MEDLINE DCOM- 20150515 LR - 20180504 IS - 1879-2723 (Electronic) IS - 0304-3991 (Linking) VI - 151 DP - 2015 Apr TI - Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip. PG - 107-115 LID - S0304-3991(14)00237-X [pii] LID - 10.1016/j.ultramic.2014.11.021 [doi] AB - A newly developed carbon cone nanotip (CCnT) has been used as field emission cathode both in low voltage SEM (30 kV) electron source and high voltage TEM (200 kV) electron source. The results clearly show, for both technologies, an unprecedented stability of the emission and the probe current with almost no decay during 1h, as well as a very small noise (rms less than 0.5%) compared to standard sources which use tungsten tips as emitting cathode. In addition, quantitative electric field mapping around the FE tip have been performed using in situ electron holography experiments during the emission of the new tip. These results show the advantage of the very high aspect ratio of the new CCnT which induces a strong enhancement of the electric field at the apex of the tip, leading to very small extraction voltage (some hundred of volts) for which the field emission will start. The combination of these experiments with emission current measurements has also allowed to extract an exit work function value of 4.8 eV. CI - Copyright (c) 2014 Elsevier B.V. All rights reserved. FAU - Houdellier, F AU - Houdellier F AD - CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France. FAU - de Knoop, L AU - de Knoop L AD - CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France. FAU - Gatel, C AU - Gatel C AD - CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France. FAU - Masseboeuf, A AU - Masseboeuf A AD - CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France. FAU - Mamishin, S AU - Mamishin S AD - Hitachi High-Technologies Corporation, 882, Ichige, Hitachinaka, Ibaraki 312-8504, Japan. FAU - Taniguchi, Y AU - Taniguchi Y AD - Hitachi High-Technologies Corporation, 882, Ichige, Hitachinaka, Ibaraki 312-8504, Japan. FAU - Delmas, M AU - Delmas M AD - CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France. FAU - Monthioux, M AU - Monthioux M AD - CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France. FAU - Hytch, M J AU - Hytch MJ AD - CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France. FAU - Snoeck, E AU - Snoeck E AD - CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse, France. LA - eng PT - Journal Article PT - Research Support, Non-U.S. Gov't DEP - 20141208 PL - Netherlands TA - Ultramicroscopy JT - Ultramicroscopy JID - 7513702 OTO - NOTNLM OT - Carbon tips OT - Electron holography OT - Electrons sources OT - Field emission EDAT- 2014/12/20 06:00 MHDA- 2014/12/20 06:01 CRDT- 2014/12/20 06:00 PHST- 2014/08/06 00:00 [received] PHST- 2014/11/19 00:00 [revised] PHST- 2014/11/20 00:00 [accepted] PHST- 2014/12/20 06:00 [entrez] PHST- 2014/12/20 06:00 [pubmed] PHST- 2014/12/20 06:01 [medline] AID - S0304-3991(14)00237-X [pii] AID - 10.1016/j.ultramic.2014.11.021 [doi] PST - ppublish SO - Ultramicroscopy. 2015 Apr;151:107-115. doi: 10.1016/j.ultramic.2014.11.021. Epub 2014 Dec 8.