PMID- 26048553 OWN - NLM STAT- MEDLINE DCOM- 20161213 LR - 20161230 IS - 1936-1335 (Electronic) IS - 1936-1327 (Linking) VI - 8 DP - 2015 TI - Electronic Biosensors Based on III-Nitride Semiconductors. PG - 149-69 LID - 10.1146/annurev-anchem-071114-040247 [doi] AB - We review recent advances of AlGaN/GaN high-electron-mobility transistor (HEMT)-based electronic biosensors. We discuss properties and fabrication of III-nitride-based biosensors. Because of their superior biocompatibility and aqueous stability, GaN-based devices are ready to be implemented as next-generation biosensors. We review surface properties, cleaning, and passivation as well as different pathways toward functionalization, and critically analyze III-nitride-based biosensors demonstrated in the literature, including those detecting DNA, bacteria, cancer antibodies, and toxins. We also discuss the high potential of these biosensors for monitoring living cardiac, fibroblast, and nerve cells. Finally, we report on current developments of covalent chemical functionalization of III-nitride devices. Our review concludes with a short outlook on future challenges and projected implementation directions of GaN-based HEMT biosensors. FAU - Kirste, Ronny AU - Kirste R AD - Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695; email: ivanisevic@ncsu.edu. FAU - Rohrbaugh, Nathaniel AU - Rohrbaugh N FAU - Bryan, Isaac AU - Bryan I FAU - Bryan, Zachary AU - Bryan Z FAU - Collazo, Ramon AU - Collazo R FAU - Ivanisevic, Albena AU - Ivanisevic A LA - eng PT - Journal Article PT - Review DEP - 20150527 PL - United States TA - Annu Rev Anal Chem (Palo Alto Calif) JT - Annual review of analytical chemistry (Palo Alto, Calif.) JID - 101508602 RN - 0 (Aluminum Compounds) RN - 0 (aluminum gallium nitride) RN - CH46OC8YV4 (Gallium) SB - IM MH - Aluminum Compounds/*chemistry MH - *Biosensing Techniques MH - *Electronics MH - Gallium/*chemistry MH - Humans MH - *Semiconductors OTO - NOTNLM OT - biosensors OT - field-effect transistors OT - nitrides OT - semiconductors OT - surfaces EDAT- 2015/06/07 06:00 MHDA- 2016/12/15 06:00 CRDT- 2015/06/07 06:00 PHST- 2015/06/07 06:00 [entrez] PHST- 2015/06/07 06:00 [pubmed] PHST- 2016/12/15 06:00 [medline] AID - 10.1146/annurev-anchem-071114-040247 [doi] PST - ppublish SO - Annu Rev Anal Chem (Palo Alto Calif). 2015;8:149-69. doi: 10.1146/annurev-anchem-071114-040247. Epub 2015 May 27.