PMID- 26295429
OWN - NLM
STAT- PubMed-not-MEDLINE
DCOM- 20150922
LR  - 20150822
IS  - 1948-7185 (Print)
IS  - 1948-7185 (Linking)
VI  - 2
IP  - 11
DP  - 2011 Jun 2
TI  - Evanescent-Wave Cavity Ring-Down Ellipsometry.
PG  - 1324-7
LID - 10.1021/jz200515d [doi]
AB  - We introduce the new technique of evanescent-wave cavity ring-down ellipsometry 
      (EW-CRDE), used for the measurement of ellipsometric angles of samples at a 
      solid-gas or solid-liquid interface, and achieve phase-shift measurements with 
      precision of  approximately 0.01 degrees . We demonstrate the technique by measuring the time-dependent 
      refractive index of methanol-water mixtures and thin films at the 
      liquid/fused-silica interface, showing that the monitoring of monolayers on 
      microsecond time scales using EW-CRDE should be achievable.
FAU - Everest, Michael A
AU  - Everest MA
AD  - daggerInstitute of Electronic Structure and Laser, Foundation for Research and 
      Technology-Hellas, 71110 Heraklion-Crete, Greece.
AD  - double daggerDepartment of Chemistry, George Fox University, Newberg, Oregon 97132, United 
      States.
FAU - Papadakis, Vassilis M
AU  - Papadakis VM
AD  - daggerInstitute of Electronic Structure and Laser, Foundation for Research and 
      Technology-Hellas, 71110 Heraklion-Crete, Greece.
FAU - Stamataki, Katerina
AU  - Stamataki K
AD  - daggerInstitute of Electronic Structure and Laser, Foundation for Research and 
      Technology-Hellas, 71110 Heraklion-Crete, Greece.
FAU - Tzortzakis, Stelios
AU  - Tzortzakis S
AD  - daggerInstitute of Electronic Structure and Laser, Foundation for Research and 
      Technology-Hellas, 71110 Heraklion-Crete, Greece.
FAU - Loppinet, Benoit
AU  - Loppinet B
AD  - daggerInstitute of Electronic Structure and Laser, Foundation for Research and 
      Technology-Hellas, 71110 Heraklion-Crete, Greece.
FAU - Rakitzis, T Peter
AU  - Rakitzis TP
AD  - daggerInstitute of Electronic Structure and Laser, Foundation for Research and 
      Technology-Hellas, 71110 Heraklion-Crete, Greece.
LA  - eng
PT  - Journal Article
DEP - 20110517
PL  - United States
TA  - J Phys Chem Lett
JT  - The journal of physical chemistry letters
JID - 101526034
OTO - NOTNLM
OT  - adsorption
OT  - cavity ring-down
OT  - ellipsometry
OT  - evanescent wave
OT  - thin films
EDAT- 2011/06/02 00:00
MHDA- 2011/06/02 00:01
CRDT- 2015/08/22 06:00
PHST- 2015/08/22 06:00 [entrez]
PHST- 2011/06/02 00:00 [pubmed]
PHST- 2011/06/02 00:01 [medline]
AID - 10.1021/jz200515d [doi]
PST - ppublish
SO  - J Phys Chem Lett. 2011 Jun 2;2(11):1324-7. doi: 10.1021/jz200515d. Epub 2011 May 
      17.