PMID- 26650068
OWN - NLM
STAT- Publisher
LR  - 20191120
IS  - 1435-8115 (Electronic)
IS  - 1431-9276 (Linking)
VI  - 21
IP  - 6
DP  - 2015 Dec
TI  - Development of Functional Surfaces on High-Density Polyethylene (HDPE) via 
      Gas-Assisted Etching (GAE) Using Focused Ion Beams.
PG  - 1379-1386
AB  - Irradiation damage, caused by the use of beams in electron and ion microscopes, 
      leads to undesired physical/chemical material property changes or uncontrollable 
      modification of structures. Particularly, soft matter such as polymers or 
      biological materials is highly susceptible and very much prone to react on 
      electron/ion beam irradiation. Nevertheless, it is possible to turn 
      degradation-dependent physical/chemical changes from negative to positive use 
      when materials are intentionally exposed to beams. Especially, controllable 
      surface modification allows tuning of surface properties for targeted purposes 
      and thus provides the use of ultimate materials and their systems at the 
      micro/nanoscale for creating functional surfaces. In this work, XeF2 and I2 gases 
      were used in the focused ion beam scanning electron microscope instrument in 
      combination with gallium ion etching of high-density polyethylene surfaces with 
      different beam currents and accordingly different gas exposure times resulting at 
      the same ion dose to optimize and develop new polymer surface properties and to 
      create functional polymer surfaces. Alterations in the surface morphologies and 
      surface chemistry due to gas-assisted etching-based nanostructuring with various 
      processing parameters were tracked using high-resolution SEM imaging, 
      complementary energy-dispersive spectroscopic analyses, and atomic force 
      microscopic investigations.
FAU - Sezen, Meltem
AU  - Sezen M
AD  - Sabanci University Nanotechnology Research and Application Center (SUNUM),34956 
      Orhanli,Istanbul,Turkey.
FAU - Bakan, Feray
AU  - Bakan F
AD  - Sabanci University Nanotechnology Research and Application Center (SUNUM),34956 
      Orhanli,Istanbul,Turkey.
LA  - eng
PT  - Journal Article
PL  - England
TA  - Microsc Microanal
JT  - Microscopy and microanalysis : the official journal of Microscopy Society of 
      America, Microbeam Analysis Society, Microscopical Society of Canada
JID - 9712707
OTO - NOTNLM
OT  - focused ion beam
OT  - functionalized polymer surfaces
OT  - gas-assisted etching
OT  - nanostructuring
OT  - surface modification
EDAT- 2015/12/10 06:00
MHDA- 2015/12/10 06:00
CRDT- 2015/12/10 06:00
PHST- 2015/12/10 06:00 [entrez]
PHST- 2015/12/10 06:00 [pubmed]
PHST- 2015/12/10 06:00 [medline]
AID - S1431927615015391 [pii]
AID - 10.1017/S1431927615015391 [doi]
PST - ppublish
SO  - Microsc Microanal. 2015 Dec;21(6):1379-1386. doi: 10.1017/S1431927615015391.