PMID- 27479713 OWN - NLM STAT- PubMed-not-MEDLINE DCOM- 20180718 LR - 20180718 IS - 1361-6528 (Electronic) IS - 0957-4484 (Linking) VI - 27 IP - 36 DP - 2016 Sep 9 TI - Metal assisted focused-ion beam nanopatterning. PG - 36LT01 LID - 10.1088/0957-4484/27/36/36LT01 [doi] AB - Focused-ion beam milling is a versatile technique for maskless nanofabrication. However, the nonuniform ion beam profile and material redeposition tend to disfigure the surface morphology near the milling areas and degrade the fidelity of nanoscale pattern transfer, limiting the applicability of the technique. The ion-beam induced damage can deteriorate the performance of photonic devices and hinders the precision of template fabrication for nanoimprint lithography. To solve the issue, we present a metal assisted focused-ion beam (MAFIB) process in which a removable sacrificial aluminum layer is utilized to protect the working material. The new technique ensures smooth surfaces and fine milling edges; in addition, it permits direct formation of v-shaped grooves with tunable angles on dielectric substrates or metal films, silver for instance, which are rarely achieved by using traditional nanolithography followed by anisotropic etching processes. MAFIB was successfully demonstrated to directly create nanopatterns on different types of substrates with high fidelity and reproducibility. The technique provides the capability and flexibility necessary to fabricate nanophotonic devices and nanoimprint templates. FAU - Kannegulla, Akash AU - Kannegulla A AD - School of Electrical Engineering and Computer Science, Oregon State University, OR 97331, USA. FAU - Cheng, Li-Jing AU - Cheng LJ LA - eng PT - Journal Article DEP - 20160801 PL - England TA - Nanotechnology JT - Nanotechnology JID - 101241272 EDAT- 2016/08/02 06:00 MHDA- 2016/08/02 06:01 CRDT- 2016/08/02 06:00 PHST- 2016/08/02 06:00 [entrez] PHST- 2016/08/02 06:00 [pubmed] PHST- 2016/08/02 06:01 [medline] AID - 10.1088/0957-4484/27/36/36LT01 [doi] PST - ppublish SO - Nanotechnology. 2016 Sep 9;27(36):36LT01. doi: 10.1088/0957-4484/27/36/36LT01. Epub 2016 Aug 1.