PMID- 27877778 OWN - NLM STAT- PubMed-not-MEDLINE LR - 20240326 IS - 1468-6996 (Print) IS - 1878-5514 (Electronic) IS - 1468-6996 (Linking) VI - 16 IP - 2 DP - 2015 Apr TI - Electronic conduction in La-based perovskite-type oxides. PG - 026001 LID - 026001 AB - A systematic study of La-based perovskite-type oxides from the viewpoint of their electronic conduction properties was performed. LaCo(0.5)Ni(0.5)O(3+/-delta) was found to be a promising candidate as a replacement for standard metals used in oxide electrodes and wiring that are operated at temperatures up to 1173 K in air because of its high electrical conductivity and stability at high temperatures. LaCo(0.5)Ni(0.5)O(3+/-delta) exhibits a high conductivity of 1.9 x 10(3) S cm(-1) at room temperature (R.T.) because of a high carrier concentration n of 2.2 x 10(22) cm(-3) and a small effective mass m * of 0.10 m(e). Notably, LaCo(0.5)Ni(0.5)O(3+/-delta) exhibits this high electrical conductivity from R.T. to 1173 K, and little change in the oxygen content occurs under these conditions. LaCo(0.5)Ni(0.5)O(3+/-delta) is the most suitable for the fabrication of oxide electrodes and wiring, though La(1-x) Sr (x) CoO(3+/-delta) and La(1-x) Sr (x) MnO(3+/-delta) also exhibit high electronic conductivity at R.T., with maximum electrical conductivities of 4.4 x 10(3) S cm(-1) for La(0.5)Sr(0.5)CoO(3+/-delta) and 1.5 x 10(3) S cm(-1) for La(0.6)Sr(0.4)MnO(3+/-delta) because oxygen release occurs in La(1-x) Sr (x) CoO(3+/-delta) as elevating temperature and the electrical conductivity of La(0.6)Sr(0.4)MnO(3+/-delta) slightly decreases at temperatures above 400 K. FAU - Kozuka, Hisashi AU - Kozuka H AD - NGK Spark Plug Co., Ltd, 2808, Iwasaki, Komaki-shi, Aichi 485-8510, Japan. FAU - Ohbayashi, Kazushige AU - Ohbayashi K AD - NGK Spark Plug Co., Ltd, 2808, Iwasaki, Komaki-shi, Aichi 485-8510, Japan. FAU - Koumoto, Kunihito AU - Koumoto K AD - Department of Applied Chemistry, Graduate School of Engineering, Nagoya University, Furo-cho Chikusa-ku, Nagoya 464-8603, Japan. LA - eng PT - Journal Article PT - Review DEP - 20150310 PL - United States TA - Sci Technol Adv Mater JT - Science and technology of advanced materials JID - 101614420 PMC - PMC5036473 OTO - NOTNLM OT - carrier concentration OT - carrier mobility OT - effective mass OT - electrical conductivity OT - electronic conduction OT - relaxation time EDAT- 2015/03/10 00:00 MHDA- 2015/03/10 00:01 PMCR- 2015/03/10 CRDT- 2016/11/24 06:00 PHST- 2014/10/15 00:00 [received] PHST- 2015/01/28 00:00 [revised] PHST- 2015/01/28 00:00 [accepted] PHST- 2016/11/24 06:00 [entrez] PHST- 2015/03/10 00:00 [pubmed] PHST- 2015/03/10 00:01 [medline] PHST- 2015/03/10 00:00 [pmc-release] AID - TSTA11661273 [pii] AID - 10.1088/1468-6996/16/2/026001 [doi] PST - epublish SO - Sci Technol Adv Mater. 2015 Mar 10;16(2):026001. doi: 10.1088/1468-6996/16/2/026001. eCollection 2015 Apr.