PMID- 28191412
OWN - NLM
STAT- PubMed-not-MEDLINE
LR  - 20200930
IS  - 2196-5404 (Print)
IS  - 2196-5404 (Electronic)
IS  - 2196-5404 (Linking)
VI  - 3
IP  - 1
DP  - 2016
TI  - Case study on risk evaluation of printed electronics using nanosilver ink.
PG  - 2
LID - 10.1186/s40580-016-0065-y [doi]
LID - 2
AB  - BACKGROUND: With the ever-increasing development of nanotechnology, our society 
      is being surrounded by possible risks related to exposure to manufactured 
      nanomaterials. The consumer market already includes many products that contain 
      silver nanoparticles (AgNPs), including various household products, such as yoga 
      mats, cutting boards, running shirts, and socks. There is a growing concern over 
      the release of AgNPs in workplaces related to the manufacture and application of 
      nanomaterials. OBJECTIVE: This study investigated the release of AgNPs during the 
      operation of a printed electronics printer. METHODS: Using an exposure simulation 
      chamber, a nanoparticle collector, scanning mobility particle sizer (SMPS), 
      condensation particle counter (CPC), dust monitor, and mixed cellulose ester 
      (MCE) filters are all connected to measure the AgNP exposure levels when 
      operating a printed electronics printer. RESULTS: A very small amount of AgNPs 
      was released during the operation of the printed electronics printer, and the 
      number of AgNPs inside the exposure simulation chamber was lower than that 
      outside background. In addition, when evaluating the potential risks for 
      consumers and workers using a margin of exposure (MOE) approach and target MOE of 
      1000, the operational results far exceeded the target MOE in this simulation 
      study and in a previous workplace exposure study. CONCLUSION: The overall results 
      indicate a no-risk concern level in the case of printed electronics using 
      nanosilver ink.
FAU - Kim, Ellen
AU  - Kim E
AD  - Institute of Nanoproduct Safety Research, Hoseo University, 165, Sechul-ri, 
      Baebang-myun, Asan, Chungnam 336-795 Korea.
FAU - Lee, Ji Hyun
AU  - Lee JH
AD  - Institute of Nanoproduct Safety Research, Hoseo University, 165, Sechul-ri, 
      Baebang-myun, Asan, Chungnam 336-795 Korea.
FAU - Kim, Jin Kwon
AU  - Kim JK
AD  - Institute of Nanoproduct Safety Research, Hoseo University, 165, Sechul-ri, 
      Baebang-myun, Asan, Chungnam 336-795 Korea.
FAU - Lee, Gun Ho
AU  - Lee GH
AD  - Department of Mechanics, Hanyang University, Ansan, Korea.
FAU - Ahn, Kangho
AU  - Ahn K
AD  - Department of Mechanics, Hanyang University, Ansan, Korea.
FAU - Park, Jung Duck
AU  - Park JD
AD  - College of Medicine, Chung-Ang University, Seoul, Korea.
FAU - Yu, Il Je
AU  - Yu IJ
AD  - Institute of Nanoproduct Safety Research, Hoseo University, 165, Sechul-ri, 
      Baebang-myun, Asan, Chungnam 336-795 Korea.
LA  - eng
PT  - Journal Article
DEP - 20160218
PL  - England
TA  - Nano Converg
JT  - Nano convergence
JID - 101695675
PMC - PMC5271149
EDAT- 2017/02/14 06:00
MHDA- 2017/02/14 06:01
PMCR- 2016/02/18
CRDT- 2017/02/14 06:00
PHST- 2015/06/07 00:00 [received]
PHST- 2015/07/17 00:00 [accepted]
PHST- 2017/02/14 06:00 [entrez]
PHST- 2017/02/14 06:00 [pubmed]
PHST- 2017/02/14 06:01 [medline]
PHST- 2016/02/18 00:00 [pmc-release]
AID - 65 [pii]
AID - 10.1186/s40580-016-0065-y [doi]
PST - ppublish
SO  - Nano Converg. 2016;3(1):2. doi: 10.1186/s40580-016-0065-y. Epub 2016 Feb 18.