PMID- 29469893
OWN - NLM
STAT- PubMed-not-MEDLINE
DCOM- 20180321
LR  - 20181023
IS  - 1539-4522 (Electronic)
IS  - 1559-128X (Linking)
VI  - 57
IP  - 5
DP  - 2018 Feb 10
TI  - Weighted spline based integration for reconstruction of freeform wavefront.
PG  - 1100-1109
LID - 10.1364/AO.57.001100 [doi]
AB  - In the present work, a spline-based integration technique for the reconstruction 
      of a freeform wavefront from the slope data has been implemented. The slope data 
      of a freeform surface contain noise due to their machining process and that 
      introduces reconstruction error. We have proposed a weighted cubic spline based 
      least square integration method (WCSLI) for the faithful reconstruction of a 
      wavefront from noisy slope data. In the proposed method, the measured slope data 
      are fitted into a piecewise polynomial. The fitted coefficients are determined by 
      using a smoothing cubic spline fitting method. The smoothing parameter locally 
      assigns relative weight to the fitted slope data. The fitted slope data are then 
      integrated using the standard least squares technique to reconstruct the freeform 
      wavefront. Simulation studies show the improved result using the proposed 
      technique as compared to the existing cubic spline-based integration (CSLI) and 
      the Southwell methods. The proposed reconstruction method has been experimentally 
      implemented to a subaperture stitching-based measurement of a freeform wavefront 
      using a scanning Shack-Hartmann sensor. The boundary artifacts are minimal in 
      WCSLI which improves the subaperture stitching accuracy and demonstrates an 
      improved Shack-Hartmann sensor for freeform metrology application.
FAU - Pant, Kamal K
AU  - Pant KK
FAU - Burada, Dali R
AU  - Burada DR
FAU - Bichra, Mohamed
AU  - Bichra M
FAU - Ghosh, Amitava
AU  - Ghosh A
FAU - Khan, Gufran S
AU  - Khan GS
FAU - Sinzinger, Stefan
AU  - Sinzinger S
FAU - Shakher, Chandra
AU  - Shakher C
LA  - eng
PT  - Journal Article
PL  - United States
TA  - Appl Opt
JT  - Applied optics
JID - 0247660
EDAT- 2018/02/23 06:00
MHDA- 2018/02/23 06:01
CRDT- 2018/02/23 06:00
PHST- 2018/02/23 06:00 [entrez]
PHST- 2018/02/23 06:00 [pubmed]
PHST- 2018/02/23 06:01 [medline]
AID - 381395 [pii]
AID - 10.1364/AO.57.001100 [doi]
PST - ppublish
SO  - Appl Opt. 2018 Feb 10;57(5):1100-1109. doi: 10.1364/AO.57.001100.