PMID- 31035494 OWN - NLM STAT- PubMed-not-MEDLINE LR - 20201001 IS - 1996-1944 (Print) IS - 1996-1944 (Electronic) IS - 1996-1944 (Linking) VI - 12 IP - 9 DP - 2019 Apr 26 TI - Optimization of Intrinsic ZnO Thickness in Cu(In,Ga)Se(2)-Based Thin Film Solar Cells. LID - 10.3390/ma12091365 [doi] LID - 1365 AB - The typical structure of high efficiency Cu(InGa)Se(2) (CIGS)-based thin film solar cells is substrate/Mo/CIGS/CdS/i-ZnO/ZnO:Al(AZO) where the sun light comes through the transparent conducting oxide (i.e., i-ZnO/AZO) side. In this study, the thickness of an intrinsic zinc oxide (i-ZnO) layer was optimized by considering the surface roughness of CIGS light absorbers. The i-ZnO layers with different thicknesses from 30 to 170 nm were deposited via sputtering. The optical properties, microstructures, and morphologies of the i-ZnO thin films with different thicknesses were characterized, and their effects on the CIGS solar cell device properties were explored. Two types of CIGS absorbers prepared by three-stage co-evaporation and two-step sulfurization after the selenization (SAS) processes showed a difference in the preferred crystal orientation, morphology, and surface roughness. During the subsequent post-processing for the fabrication of the glass/Mo/CIGS/CdS/i-ZnO/AZO device, the change in the i-ZnO thickness influenced the performance of the CIGS devices. For the three-stage co-evaporated CIGS cell, the increase in the thickness of the i-ZnO layer from 30 to 90 nm improved the shunt resistance (R(SH)), open circuit voltage, and fill factor (FF), as well as the conversion efficiency (10.1% to 11.8%). A further increas of the i-ZnO thickness to 170 nm, deteriorated the device performance parameters, which suggests that 90 nm is close to the optimum thickness of i-ZnO. Conversely, the device with a two-step SAS processed CIGS absorber showed smaller values of the overall R(SH) (130-371 Omega cm(2)) than that of the device with a three-stage co-evaporated CIGS absorber (530-1127 Omega cm(2)) ranging from 30 nm to 170 nm of i-ZnO thickness. Therefore, the value of the shunt resistance was monotonically increased with the i-ZnO thickness ranging from 30 to 170 nm, which improved the FF and conversion efficiency (6.96% to 8.87%). FAU - Alhammadi, Salh AU - Alhammadi S AD - School of Chemical Engineering, Yeungnam University, 280 Daehak-ro, Gyeongsan 38541, Korea. salehalhammadi.1987@gmail.com. FAU - Park, Hyeonwook AU - Park H AD - School of Chemical Engineering, Yeungnam University, 280 Daehak-ro, Gyeongsan 38541, Korea. greatekal@naver.com. FAU - Kim, Woo Kyoung AU - Kim WK AD - School of Chemical Engineering, Yeungnam University, 280 Daehak-ro, Gyeongsan 38541, Korea. wkim@ynu.ac.kr. LA - eng PT - Journal Article DEP - 20190426 PL - Switzerland TA - Materials (Basel) JT - Materials (Basel, Switzerland) JID - 101555929 PMC - PMC6539136 OTO - NOTNLM OT - CIGS OT - Cu(In,Ga)Se2 OT - i-ZnO OT - intrinsic ZnO OT - shunt resistance OT - solar cell material COIS- The authors declare no conflict of interest. EDAT- 2019/05/01 06:00 MHDA- 2019/05/01 06:01 PMCR- 2019/04/26 CRDT- 2019/05/01 06:00 PHST- 2019/04/01 00:00 [received] PHST- 2019/04/21 00:00 [revised] PHST- 2019/04/22 00:00 [accepted] PHST- 2019/05/01 06:00 [entrez] PHST- 2019/05/01 06:00 [pubmed] PHST- 2019/05/01 06:01 [medline] PHST- 2019/04/26 00:00 [pmc-release] AID - ma12091365 [pii] AID - materials-12-01365 [pii] AID - 10.3390/ma12091365 [doi] PST - epublish SO - Materials (Basel). 2019 Apr 26;12(9):1365. doi: 10.3390/ma12091365.