PMID- 32752794 OWN - NLM STAT- PubMed-not-MEDLINE LR - 20200805 IS - 1089-7623 (Electronic) IS - 0034-6748 (Linking) VI - 91 IP - 7 DP - 2020 Jul 1 TI - Application of electrospray-scanning mobility particle sizer for the measurement of sub-10 nm chemical mechanical planarization slurry abrasive size distribution. PG - 075117 LID - 10.1063/5.0007167 [doi] AB - A scanning mobility particle sizer (SMPS) was used for measuring the size of a sub-10 nm chemical mechanical planarization slurry abrasive. An atomizer and an electrospray were used for aerosolization of slurry abrasives. It was difficult to measure the exact particle size distribution using the atomizer due to the agglomeration peak generated by the relatively large droplet size. However, the electrospray-SMPS (ES-SMPS) measurement result well matched with that of the transmission electron microscopy analysis without the agglomeration peak as ES is known to generate a relatively small droplet during aerosolization. The particle size distribution of the two sub-10 nm ceria slurries was measured using the ES-SMPS. To avoid the dispersion stability issue due to the pH change, pH adjustment was required when the sample was diluted. FAU - Kwak, Donggeon AU - Kwak D AUID- ORCID: 0000000277683466 AD - Department of Mechanical Engineering, Sungkyunkwan University, Suwon 16419, South Korea. FAU - Kim, Juhwan AU - Kim J AUID- ORCID: 0000000328106141 AD - Department of Mechanical Engineering, Sungkyunkwan University, Suwon 16419, South Korea. FAU - Oh, Seungjun AU - Oh S AUID- ORCID: 0000000335251371 AD - Department of Mechanical Engineering, Sungkyunkwan University, Suwon 16419, South Korea. FAU - Bae, Chulwoo AU - Bae C AUID- ORCID: 000000015350469X AD - SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 16419, South Korea. FAU - Kim, Taesung AU - Kim T AUID- ORCID: 0000000162807668 AD - Department of Mechanical Engineering, Sungkyunkwan University, Suwon 16419, South Korea. LA - eng PT - Journal Article PL - United States TA - Rev Sci Instrum JT - The Review of scientific instruments JID - 0405571 SB - IM EDAT- 2020/08/06 06:00 MHDA- 2020/08/06 06:01 CRDT- 2020/08/06 06:00 PHST- 2020/08/06 06:00 [entrez] PHST- 2020/08/06 06:00 [pubmed] PHST- 2020/08/06 06:01 [medline] AID - 10.1063/5.0007167 [doi] PST - ppublish SO - Rev Sci Instrum. 2020 Jul 1;91(7):075117. doi: 10.1063/5.0007167.