PMID- 32872950 OWN - NLM STAT- PubMed-not-MEDLINE LR - 20200902 IS - 1089-7623 (Electronic) IS - 0034-6748 (Linking) VI - 91 IP - 8 DP - 2020 Aug 1 TI - Tunable cavity-enhanced terahertz frequency-domain optical Hall effect. PG - 083903 LID - 10.1063/5.0010267 [doi] AB - Presented here is the development and demonstration of a tunable cavity-enhanced terahertz (THz) frequency-domain optical Hall effect (OHE) technique. The cavity consists of at least one fixed and one tunable Fabry-Perot resonator. The approach is suitable for the enhancement of the optical signatures produced by the OHE in semi-transparent conductive layer structures with plane parallel interfaces. Tuning one of the cavity parameters, such as the external cavity thickness, permits shifting of the frequencies of the constructive interference and provides substantial enhancement of the optical signatures produced by the OHE. A cavity-tuning optical stage and gas flow cell are used as examples of instruments that exploit tuning an external cavity to enhance polarization changes in a reflected THz beam. Permanent magnets are used to provide the necessary external magnetic field. Conveniently, the highly reflective surface of a permanent magnet can be used to create the tunable external cavity. The signal enhancement allows the extraction of the free charge carrier properties of thin films and can eliminate the need for expensive superconducting magnets. Furthermore, the thickness of the external cavity establishes an additional independent measurement condition, similar to, for example, the magnetic field strength, THz frequency, and angle of incidence. A high electron mobility transistor (HEMT) structure and epitaxial graphene are studied as examples. The tunable cavity-enhancement effect provides a maximum increase of more than one order of magnitude in the change of certain polarization components for both the HEMT structure and epitaxial graphene at particular frequencies and external cavity sizes. FAU - Knight, Sean AU - Knight S AUID- ORCID: 0000000227586967 AD - Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0511, USA. FAU - Schoche, Stefan AU - Schoche S AD - J. A. Woollam Co., Inc., Lincoln, Nebraska 68508-2243, USA. FAU - Kuhne, Philipp AU - Kuhne P AUID- ORCID: 0000000288277404 AD - Terahertz Materials Analysis Center, THeMAC and Center for III-Nitride Technology, C3NiT-Janzen, Department of Physics, Chemistry and Biology, Linkoping University, SE 58183 Linkoping, Sweden. FAU - Hofmann, Tino AU - Hofmann T AUID- ORCID: 0000000333629959 AD - Department of Physics and Optical Science, University of North Carolina at Charlotte, Charlotte, North Carolina 28223, USA. FAU - Darakchieva, Vanya AU - Darakchieva V AUID- ORCID: 0000000281127411 AD - Terahertz Materials Analysis Center, THeMAC and Center for III-Nitride Technology, C3NiT-Janzen, Department of Physics, Chemistry and Biology, Linkoping University, SE 58183 Linkoping, Sweden. FAU - Schubert, Mathias AU - Schubert M AUID- ORCID: 000000016238663X AD - Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0511, USA. LA - eng PT - Journal Article PL - United States TA - Rev Sci Instrum JT - The Review of scientific instruments JID - 0405571 SB - IM EDAT- 2020/09/03 06:00 MHDA- 2020/09/03 06:01 CRDT- 2020/09/03 06:00 PHST- 2020/09/03 06:00 [entrez] PHST- 2020/09/03 06:00 [pubmed] PHST- 2020/09/03 06:01 [medline] AID - 10.1063/5.0010267 [doi] PST - ppublish SO - Rev Sci Instrum. 2020 Aug 1;91(8):083903. doi: 10.1063/5.0010267.