PMID- 32894447 OWN - NLM STAT- MEDLINE DCOM- 20210128 LR - 20210128 IS - 1614-7499 (Electronic) IS - 0944-1344 (Linking) VI - 28 IP - 4 DP - 2021 Jan TI - Sol-gel-derived transparent metal oxide flexible field effect transistors. PG - 3928-3941 LID - 10.1007/s11356-020-10459-y [doi] AB - ZnO and ZnO:Al thin films have been successfully synthesized by simple solution processable method at low temperature. Highly crystalline (002) preferentially oriented, uniform, and smooth ZnO:Al thin films are produced. The electrical, J-V and C-V, measurements revealed higher current flow and more carrier concentration, respectively, for ZnO:Al samples compared with pristine ZnO. ZnO- and ZnO:Al-based field effect transistors (FETs) were fabricated using SiO(2) and TiO(2) gate dielectric layers onto flexible plastic, ITO and rigid, p-Si substrates. The ZnO:Al-based FETs measured better transistor performance with both SiO(2) and TiO(2) gate dielectrics as compared with ZnO-based TFTs. The saturated field effect mobilities 5.78 and 4.96 cm(2)/Vs were measured for ZnO:Al-based TFTs with SiO(2) and TiO(2) dielectrics, which reasonably higher than 0.51 and 0.43 cm(2)/Vs, respectively, measured for pristine ZnO TFTs. The effect of smooth surface and reduced grain boundaries of ZnO:Al layer contributed to measure the low-interface trap density and trap density at grain boundaries. The reported procedure can be applicable to produce large area transparent electronics onto flexible plastic substrates. FAU - Londhe, Priyanka AU - Londhe P AD - Department of Chemistry, Savitribai Phule Pune University (formerly University of Pune), Pune, 411007, India. FAU - Athawale, Anjali AU - Athawale A AD - Department of Chemistry, Savitribai Phule Pune University (formerly University of Pune), Pune, 411007, India. FAU - Chaure, Nandu B AU - Chaure NB AUID- ORCID: 0000-0002-4134-5019 AD - Department of Physics, Savitribai Phule Pune University (formerly University of Pune), Pune, 411007, India. nchaure.uop@gmail.com. LA - eng PT - Journal Article DEP - 20200907 PL - Germany TA - Environ Sci Pollut Res Int JT - Environmental science and pollution research international JID - 9441769 RN - 0 (Oxides) RN - 7631-86-9 (Silicon Dioxide) RN - SOI2LOH54Z (Zinc Oxide) SB - IM MH - Electricity MH - Oxides MH - Silicon Dioxide MH - *Transistors, Electronic MH - *Zinc Oxide OTO - NOTNLM OT - Al-doped ZnO OT - Electrical conductivity OT - Field effect transistors OT - Saturated mobility EDAT- 2020/09/08 06:00 MHDA- 2021/01/29 06:00 CRDT- 2020/09/07 12:13 PHST- 2020/02/21 00:00 [received] PHST- 2020/08/10 00:00 [accepted] PHST- 2020/09/08 06:00 [pubmed] PHST- 2021/01/29 06:00 [medline] PHST- 2020/09/07 12:13 [entrez] AID - 10.1007/s11356-020-10459-y [pii] AID - 10.1007/s11356-020-10459-y [doi] PST - ppublish SO - Environ Sci Pollut Res Int. 2021 Jan;28(4):3928-3941. doi: 10.1007/s11356-020-10459-y. Epub 2020 Sep 7.