PMID- 33396432
OWN - NLM
STAT- PubMed-not-MEDLINE
LR  - 20210112
IS  - 1996-1944 (Print)
IS  - 1996-1944 (Electronic)
IS  - 1996-1944 (Linking)
VI  - 14
IP  - 1
DP  - 2020 Dec 31
TI  - Electrical and Optical Properties of Co(75)Si(15)B(10) Metallic Glass Nanometric 
      Thin Films.
LID - 10.3390/ma14010162 [doi]
LID - 162
AB  - Co-based (Co(75)Si(15)B(10)) thin-film metallic glass (TFMG) with nanometric 
      thicknesses (100~300 nm) was investigated for its structural, electrical, and 
      optical properties. The TFMG structure was examined using scanning electron 
      microscopy and X-ray diffraction, while electrical properties were examined using 
      inductance/capacitance/resistance spectroscopy, cyclic voltammetry, and Hall 
      effect measurements. In addition, optical absorption/reflection/transmittance 
      measurements were performed to examine optical properties. Results revealed that 
      Co-based TFMGs, which have an amorphous structure without surface defects, behave 
      like a dielectric material, with higher resistivity and much lower carrier 
      concentration than pure cobalt (Co) thin films of the same thickness, despite its 
      mobility being modestly larger than its Co counterparts. Meanwhile, the optical 
      investigation of TFMG enabled us to determine the complex relative permittivity 
      (complex relative dielectric constant) ϵr  at a visible wavelength (632.8 nm). 
      Moreover, unlike normal metals, TFMGs exhibited a large positive value of the 
      real part of ϵr , while exhibiting properties of substantial absorption of light 
      (absorption coefficient alpha). It was also found that the Co-based TFMG gained 
      optical transparency for thicknesses less than 5 nm. TFMGs demonstrated the 
      nearly thickness-independent properties of the electrical and optical parameters 
      probed, a feature of high-index, dielectric-like material with negligible size 
      effects, which may have applications in micrometer-scaled optoelectronic and 
      magneto-optical devices.
FAU - Shauyenova, Danagul
AU  - Shauyenova D
AD  - Department of Physics, Gachon University, Seongnam, Gyeonggi-do 13120, Korea.
FAU - Jung, Sol
AU  - Jung S
AD  - Department of Physics, Sookmyung Women's University, Seoul 04310, Korea.
FAU - Yang, Haneul
AU  - Yang H
AD  - Department of Physics, Sookmyung Women's University, Seoul 04310, Korea.
FAU - Yim, Haein
AU  - Yim H
AD  - Department of Physics, Sookmyung Women's University, Seoul 04310, Korea.
FAU - Ju, Heongkyu
AU  - Ju H
AUID- ORCID: 0000-0003-0223-7864
AD  - Department of Physics, Gachon University, Seongnam, Gyeonggi-do 13120, Korea.
LA  - eng
PT  - Journal Article
DEP - 20201231
PL  - Switzerland
TA  - Materials (Basel)
JT  - Materials (Basel, Switzerland)
JID - 101555929
PMC - PMC7795092
OTO - NOTNLM
OT  - Co-based metallic glasses
OT  - amorphous alloys
OT  - electrical and optical characterization
OT  - microscaled devices
OT  - thin films
COIS- The authors declare no conflict of interest. The funders had no role in the 
      design of the study; in the collection, analyses, or interpretation of data; in 
      the writing of the manuscript, or in the decision to publish the results.
EDAT- 2021/01/06 06:00
MHDA- 2021/01/06 06:01
PMCR- 2020/12/31
CRDT- 2021/01/05 01:13
PHST- 2020/11/12 00:00 [received]
PHST- 2020/12/23 00:00 [revised]
PHST- 2020/12/24 00:00 [accepted]
PHST- 2021/01/05 01:13 [entrez]
PHST- 2021/01/06 06:00 [pubmed]
PHST- 2021/01/06 06:01 [medline]
PHST- 2020/12/31 00:00 [pmc-release]
AID - ma14010162 [pii]
AID - materials-14-00162 [pii]
AID - 10.3390/ma14010162 [doi]
PST - epublish
SO  - Materials (Basel). 2020 Dec 31;14(1):162. doi: 10.3390/ma14010162.