PMID- 33580343
OWN - NLM
STAT- PubMed-not-MEDLINE
LR  - 20210215
IS  - 2287-4445 (Electronic)
IS  - 2287-5123 (Print)
IS  - 2234-6198 (Linking)
VI  - 50
IP  - 1
DP  - 2019 Dec 31
TI  - Introduction to the standard reference data of electron energy loss spectra and 
      their database: eel.geri.re.kr.
PG  - 2
LID - 10.1186/s42649-019-0015-3 [doi]
LID - 2
AB  - Electron energy loss spectroscopy (EELS) is an analytical technique that can 
      provide the structural, physical and chemical information of materials. The EELS 
      spectra can be obtained by combining with TEM at sub-nanometer spatial 
      resolution. However, EELS spectral information can't be obtained easily because 
      in order to interpret EELS spectra, we need to refer to and/or compare many 
      reference data with each other. And in addition to that, we should consider the 
      different experimental variables used to produce each data. Therefore, reliable 
      and easily interpretable EELS standard reference data are needed.Our Electron 
      Energy Loss Data Center (EELDC) has been designated as National Standard Electron 
      Energy Loss Data Center No. 34 to develop EELS standard reference (SR) data and 
      to play a role in dissemination and diffusion of the SR data to users. EELDC has 
      developed and collected EEL SR data for the materials required by major 
      industries and has a total of 82 EEL SR data. Also, we have created an online 
      platform that provides a one-stop-place to help users interpret quickly EELS 
      spectra and get various spectral information. In this paper, we introduce EEL SR 
      data, the homepage of EELDC and how to use them.
FAU - Chae, Jeong Eun
AU  - Chae JE
AD  - Test Analysis Research Center, Innovative Technology Research Division, Gumi 
      Electronics & Information Technology Research Institute, Gumi, 39171, South 
      Korea.
FAU - Kim, Ji-Soo
AU  - Kim JS
AD  - Test Analysis Research Center, Innovative Technology Research Division, Gumi 
      Electronics & Information Technology Research Institute, Gumi, 39171, South 
      Korea.
FAU - Nam, Sang-Yeol
AU  - Nam SY
AD  - Test Analysis Research Center, Innovative Technology Research Division, Gumi 
      Electronics & Information Technology Research Institute, Gumi, 39171, South 
      Korea.
FAU - Kim, Min Su
AU  - Kim MS
AD  - Test Analysis Research Center, Innovative Technology Research Division, Gumi 
      Electronics & Information Technology Research Institute, Gumi, 39171, South 
      Korea.
FAU - Park, Jucheol
AU  - Park J
AUID- ORCID: 0000-0002-9489-1638
AD  - Test Analysis Research Center, Innovative Technology Research Division, Gumi 
      Electronics & Information Technology Research Institute, Gumi, 39171, South 
      Korea. jcpark13@geri.re.kr.
LA  - eng
GR  - 10080654/Ministry of Trade, Industry and Energy (KR)/
GR  - 10080654/Korea Display Research Corporation/
PT  - Journal Article
DEP - 20191231
PL  - Korea (South)
TA  - Appl Microsc
JT  - Applied microscopy
JID - 101698575
PMC - PMC7818363
OTO - NOTNLM
OT  - Electron energy loss data center
OT  - Electron energy loss spectroscopy
OT  - Standard reference
OT  - Transmission electron microscopy
COIS- The authors declare that they have no competing interests.
EDAT- 2019/12/31 00:00
MHDA- 2019/12/31 00:01
PMCR- 2019/12/31
CRDT- 2021/02/13 05:52
PHST- 2019/09/04 00:00 [received]
PHST- 2019/10/25 00:00 [accepted]
PHST- 2021/02/13 05:52 [entrez]
PHST- 2019/12/31 00:00 [pubmed]
PHST- 2019/12/31 00:01 [medline]
PHST- 2019/12/31 00:00 [pmc-release]
AID - 10.1186/s42649-019-0015-3 [pii]
AID - 15 [pii]
AID - 10.1186/s42649-019-0015-3 [doi]
PST - epublish
SO  - Appl Microsc. 2019 Dec 31;50(1):2. doi: 10.1186/s42649-019-0015-3.