PMID- 33648138
OWN - NLM
STAT- PubMed-not-MEDLINE
LR  - 20210302
IS  - 1089-7623 (Electronic)
IS  - 0034-6748 (Linking)
VI  - 92
IP  - 2
DP  - 2021 Feb 1
TI  - Cryogenic GaAs high-electron-mobility-transistor amplifier for current noise 
      measurements.
PG  - 023910
LID - 10.1063/5.0036419 [doi]
AB  - We show that a cryogenic amplifier composed of a homemade GaAs 
      high-electron-mobility transistor (HEMT) is suitable for current-noise 
      measurements in a mesoscopic device at dilution-refrigerator temperatures. The 
      lower noise characteristics of our homemade HEMT lead to a lower noise floor in 
      the experimental setup and enable more efficient current-noise measurement than 
      is available with a commercial HEMT. We present the dc transport properties of 
      the HEMT and the gain and noise characteristics of the amplifier. With the 
      amplifier employed for current-noise measurements in a quantum point contact, we 
      demonstrate the high resolution of the measurement setup by comparing it with 
      that of the conventional one using a commercial HEMT.
FAU - Lee, Sanghyun
AU  - Lee S
AUID- ORCID: 0000000238623946
AD  - NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, 
      Atsugi, Kanagawa 243-0198, Japan.
FAU - Hashisaka, Masayuki
AU  - Hashisaka M
AUID- ORCID: 0000000313016119
AD  - NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, 
      Atsugi, Kanagawa 243-0198, Japan.
FAU - Akiho, Takafumi
AU  - Akiho T
AD  - NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, 
      Atsugi, Kanagawa 243-0198, Japan.
FAU - Kobayashi, Kensuke
AU  - Kobayashi K
AUID- ORCID: 0000000170725945
AD  - Graduate School of Science, Osaka University, 1-1, Machikaneyama, Toyonaka, Osaka 
      560-0043, Japan.
FAU - Muraki, Koji
AU  - Muraki K
AUID- ORCID: 0000000302895496
AD  - NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, 
      Atsugi, Kanagawa 243-0198, Japan.
LA  - eng
PT  - Journal Article
PL  - United States
TA  - Rev Sci Instrum
JT  - The Review of scientific instruments
JID - 0405571
SB  - IM
EDAT- 2021/03/03 06:00
MHDA- 2021/03/03 06:01
CRDT- 2021/03/02 01:00
PHST- 2021/03/02 01:00 [entrez]
PHST- 2021/03/03 06:00 [pubmed]
PHST- 2021/03/03 06:01 [medline]
AID - 10.1063/5.0036419 [doi]
PST - ppublish
SO  - Rev Sci Instrum. 2021 Feb 1;92(2):023910. doi: 10.1063/5.0036419.