PMID- 35539659 OWN - NLM STAT- PubMed-not-MEDLINE LR - 20220512 IS - 2046-2069 (Electronic) IS - 2046-2069 (Linking) VI - 8 IP - 34 DP - 2018 May 22 TI - Enhanced efficiency of Cu(2)ZnSn(S,Se)(4) solar cells via anti-reflectance properties and surface passivation by atomic layer deposited aluminum oxide. PG - 19213-19219 LID - 10.1039/c8ra03437k [doi] AB - Reducing interface recombination losses is one of the major challenges in developing Cu(2)ZnSn(S,Se)(4) (CZTSSe) solar cells. Here, we propose a CZTSSe solar cell with an atomic layer deposited Al(2)O(3) thin film for surface passivation. The influence of passivation layer thickness on the power conversion efficiency (PCE), short-circuit current density (J (sc)), open-circuit voltage (V (oc)) and fill factor (FF) of the solar cell is systematically investigated. It is found that the Al(2)O(3) film presents notable antireflection (AR) properties over a broad range of wavelengths (350-1000 nm) for CZTSSe solar cells. With increasing Al(2)O(3) thickness (1-10 nm), the average reflectance of the CZTSSe film decreases from 12.9% to 9.6%, compared with the average reflectance of 13.6% for the CZTSSe film without Al(2)O(3). The Al(2)O(3) passivation layer also contributes to suppressed surface recombination and enhanced carrier separation. Passivation performance is related to chemical and field effect passivation, which is due to released H atoms from the Al-OH bonds and the formation of Al vacancies and O interstitials within Al(2)O(3) films. Therefore, the J (sc) and V (oc) of the CZTSSe solar cell with 2 nm-Al(2)O(3) were increased by 37.8% and 57.8%, respectively, in comparison with those of the unpassivated sample. An optimal CZTSSe solar cell was obtained with a V (oc), J (sc) and eta of 0.361 V, 33.78 mA and 5.66%. Our results indicate that Al(2)O(3) films show the dual functions of AR and surface passivation for photovoltaic applications. CI - This journal is (c) The Royal Society of Chemistry. FAU - Zhang, Bingye AU - Zhang B AUID- ORCID: 0000-0002-2368-9758 AD - Department of Physics, Dalian University of Technology Dalian Liaoning 116023 P. R. China byzhang@dlut.edu.cn. FAU - Han, Lu AU - Han L AD - Department of Physics, Dalian University of Technology Dalian Liaoning 116023 P. R. China byzhang@dlut.edu.cn. FAU - Ying, Shitian AU - Ying S AD - Department of Physics, Dalian University of Technology Dalian Liaoning 116023 P. R. China byzhang@dlut.edu.cn. FAU - Li, Yongfeng AU - Li Y AD - Key Laboratory of Physics and Technology for Advanced Batteries (Ministry of Education), College of Physics, Jilin University Changchun 130012 China binyao@jlu.edu.cn. FAU - Yao, Bin AU - Yao B AD - Key Laboratory of Physics and Technology for Advanced Batteries (Ministry of Education), College of Physics, Jilin University Changchun 130012 China binyao@jlu.edu.cn. LA - eng PT - Journal Article DEP - 20180524 PL - England TA - RSC Adv JT - RSC advances JID - 101581657 PMC - PMC9080692 COIS- There are no conflicts to declare. EDAT- 2018/05/24 00:00 MHDA- 2018/05/24 00:01 PMCR- 2018/05/24 CRDT- 2022/05/11 03:49 PHST- 2018/04/21 00:00 [received] PHST- 2018/05/15 00:00 [accepted] PHST- 2022/05/11 03:49 [entrez] PHST- 2018/05/24 00:00 [pubmed] PHST- 2018/05/24 00:01 [medline] PHST- 2018/05/24 00:00 [pmc-release] AID - c8ra03437k [pii] AID - 10.1039/c8ra03437k [doi] PST - epublish SO - RSC Adv. 2018 May 24;8(34):19213-19219. doi: 10.1039/c8ra03437k. eCollection 2018 May 22.