PMID- 37639375
OWN - NLM
STAT- Publisher
LR  - 20230929
IS  - 1435-8115 (Electronic)
IS  - 1431-9276 (Linking)
VI  - 29
IP  - 5
DP  - 2023 Sep 29
TI  - Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry to Depth 
      Profile Nanoparticles in Polymer Nanocomposites.
PG  - 1557-1565
LID - 10.1093/micmic/ozad085 [doi]
AB  - Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a versatile 
      surface-sensitive technique for characterizing both hard and soft matter. Its 
      chemical and molecular specificity, high spatial resolution, and superior 
      sensitivity make it an ideal method for depth profiling polymeric systems, 
      including those comprised of both inorganic and organic constituents (i.e., 
      polymer nanocomposites, PNCs). To best utilize ToF-SIMS for characterizing PNCs, 
      experimental conditions must be optimized to minimize challenges such as the 
      matrix effect and charge accumulation. Toward that end, we have successfully used 
      ToF-SIMS with a Xe+ focused ion beam to depth profile silica nanoparticles 
      grafted with poly(methyl methacrylate) (PMMA-NP) in a 
      poly(styrene-ran-acrylonitrile) matrix film by selecting conditions that address 
      charge compensation and the primary incident beam angles. By tracking the 
      sputtered Si+ species and fitting the resultant concentration profile, the 
      diffusion coefficient of PMMA-NP was determined to be D = 2.4 x 10-14 cm2/s. This 
      value of D lies between that measured using Rutherford backscattering 
      spectrometry (6.4 x 10-14 cm2/s) and the value predicted by the Stokes-Einstein 
      model (2.5 x 10-15 cm2/s). With carefully tuned experimental parameters, ToF-SIMS 
      holds great potential for quantitatively characterizing the nanoparticles at the 
      surfaces and interfaces within PNC materials as well as soft matter in general.
CI  - (c) The Author(s) 2023. Published by Oxford University Press on behalf of the 
      Microscopy Society of America. All rights reserved. For permissions, please 
      e-mail: journals.permissions@oup.com.
FAU - Zhang, Aria C
AU  - Zhang AC
AUID- ORCID: 0000-0002-7927-7912
AD  - Materials Science and Engineering, University of Pennsylvania, 3231 Walnut 
      Street, Philadelphia, Pennsylvania 19104, USA.
AD  - Materials Research Science & Engineering Center (MRSEC), University of 
      Pennsylvania, 3231 Walnut Street, Philadelphia 19104, USA.
FAU - Maguire, Shawn M
AU  - Maguire SM
AUID- ORCID: 0000-0002-5317-4990
AD  - Materials Science and Engineering, University of Pennsylvania, 3231 Walnut 
      Street, Philadelphia, Pennsylvania 19104, USA.
FAU - Ford, Jamie T
AU  - Ford JT
AUID- ORCID: 0000-0002-7657-2465
AD  - Nanoscale Characterization Facility, University of Pennsylvania, 3205 Walnut 
      Street, Philadelphia, Pennsylvania 19104, USA.
FAU - Composto, Russell J
AU  - Composto RJ
AD  - Materials Science and Engineering, University of Pennsylvania, 3231 Walnut 
      Street, Philadelphia, Pennsylvania 19104, USA.
AD  - Materials Research Science & Engineering Center (MRSEC), University of 
      Pennsylvania, 3231 Walnut Street, Philadelphia 19104, USA.
LA  - eng
GR  - NSF/
GR  - DMR1905912/DMR Polymers Program/
GR  - MRSEC-DMR-1720530/University of Pennsylvania/
PT  - Journal Article
PL  - England
TA  - Microsc Microanal
JT  - Microscopy and microanalysis : the official journal of Microscopy Society of 
      America, Microbeam Analysis Society, Microscopical Society of Canada
JID - 9712707
SB  - IM
OTO - NOTNLM
OT  - depth profiles
OT  - diffusion
OT  - polymer nanocomposites
OT  - surface and interface
OT  - time-of-flight secondary ion mass spectrometry
COIS- Conflict of Interest The authors declare that they have no competing interest.
EDAT- 2023/08/28 18:41
MHDA- 2023/08/28 18:41
CRDT- 2023/08/28 13:12
PHST- 2023/05/02 00:00 [received]
PHST- 2023/07/10 00:00 [revised]
PHST- 2023/07/30 00:00 [accepted]
PHST- 2023/08/28 18:41 [pubmed]
PHST- 2023/08/28 18:41 [medline]
PHST- 2023/08/28 13:12 [entrez]
AID - 7252807 [pii]
AID - 10.1093/micmic/ozad085 [doi]
PST - ppublish
SO  - Microsc Microanal. 2023 Sep 29;29(5):1557-1565. doi: 10.1093/micmic/ozad085.