PMID- 37687937
OWN - NLM
STAT- PubMed-not-MEDLINE
LR  - 20230912
IS  - 1424-8220 (Electronic)
IS  - 1424-8220 (Linking)
VI  - 23
IP  - 17
DP  - 2023 Aug 28
TI  - Optimization of Magnetoimpedance Effect and Magnetic Properties of Fe-Rich 
      Glass-Coated Microwires by Annealing.
LID - 10.3390/s23177481 [doi]
LID - 7481
AB  - As-prepared Fe-rich microwires with perfectly rectangular hysteresis loops 
      present magnetization reversal through fast domain wall propagation, while the 
      giant magnetoimpedance (GMI) effect in Fe-rich microwires is rather low. However, 
      the lower cost of Fe-rich microwires makes them attractive for magnetic sensors 
      applications. We studied the effect of conventional (furnace) annealing and Joule 
      heating on magnetic-propertied domain wall (DW) dynamics and the GMI effect in 
      two Fe microwires with different geometries. We observed that magnetic softness, 
      GMI effect and domain wall (DW) dynamics can be substantially improved by 
      appropriate annealing. Observed experimental results are discussed considering 
      the counterbalance between the internal stresses relaxation and induced magnetic 
      anisotropy associated with the presence of an Oersted magnetic field during Joule 
      heating.
FAU - Gonzalez, Alvaro
AU  - Gonzalez A
AUID- ORCID: 0000-0003-4946-022X
AD  - Department of Polymers and Advanced Materials: Physics, Chemistry and Technology, 
      Faculty of Chemistry, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
AD  - Departamento de Fisica Aplicada, Escuela de Ingenieria de Gipuzkoa, University of 
      the Basque Country (UPV/EHU), 20018 San Sebastian, Spain.
AD  - EHU Quantum Center, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
FAU - Garcia-Gomez, Alfonso
AU  - Garcia-Gomez A
AUID- ORCID: 0000-0002-2326-8419
AD  - Department of Polymers and Advanced Materials: Physics, Chemistry and Technology, 
      Faculty of Chemistry, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
AD  - Departamento de Fisica Aplicada, Escuela de Ingenieria de Gipuzkoa, University of 
      the Basque Country (UPV/EHU), 20018 San Sebastian, Spain.
AD  - EHU Quantum Center, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
FAU - Zhukova, Valentina
AU  - Zhukova V
AUID- ORCID: 0000-0002-2926-9826
AD  - Department of Polymers and Advanced Materials: Physics, Chemistry and Technology, 
      Faculty of Chemistry, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
AD  - Departamento de Fisica Aplicada, Escuela de Ingenieria de Gipuzkoa, University of 
      the Basque Country (UPV/EHU), 20018 San Sebastian, Spain.
AD  - EHU Quantum Center, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
FAU - Corte-Leon, Paula
AU  - Corte-Leon P
AUID- ORCID: 0000-0002-2073-5798
AD  - Department of Polymers and Advanced Materials: Physics, Chemistry and Technology, 
      Faculty of Chemistry, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
AD  - Departamento de Fisica Aplicada, Escuela de Ingenieria de Gipuzkoa, University of 
      the Basque Country (UPV/EHU), 20018 San Sebastian, Spain.
AD  - EHU Quantum Center, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
FAU - Ipatov, Mihail
AU  - Ipatov M
AUID- ORCID: 0000-0003-3007-7175
AD  - Department of Polymers and Advanced Materials: Physics, Chemistry and Technology, 
      Faculty of Chemistry, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
AD  - Departamento de Fisica Aplicada, Escuela de Ingenieria de Gipuzkoa, University of 
      the Basque Country (UPV/EHU), 20018 San Sebastian, Spain.
FAU - Blanco, Juan Maria
AU  - Blanco JM
AD  - Departamento de Fisica Aplicada, Escuela de Ingenieria de Gipuzkoa, University of 
      the Basque Country (UPV/EHU), 20018 San Sebastian, Spain.
AD  - EHU Quantum Center, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
FAU - Gonzalez, Julian
AU  - Gonzalez J
AD  - Department of Polymers and Advanced Materials: Physics, Chemistry and Technology, 
      Faculty of Chemistry, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
AD  - EHU Quantum Center, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
FAU - Zhukov, Arcady
AU  - Zhukov A
AUID- ORCID: 0000-0001-5025-4859
AD  - Department of Polymers and Advanced Materials: Physics, Chemistry and Technology, 
      Faculty of Chemistry, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
AD  - Departamento de Fisica Aplicada, Escuela de Ingenieria de Gipuzkoa, University of 
      the Basque Country (UPV/EHU), 20018 San Sebastian, Spain.
AD  - EHU Quantum Center, University of the Basque Country (UPV/EHU), 20018 San 
      Sebastian, Spain.
AD  - IKERBASQUE, Basque Foundation for Science, 48011 Bilbao, Spain.
LA  - eng
GR  - "INFINITE" (HORIZON-CL5-2021-D5-01-06)/Horizon Europe/
GR  - PID2022-141373NB-I00/Spanish MICIN/
GR  - PUE_2021_1_0009, "Ayuda a Grupos Consolidados" (ref. IT1670-22) and Elkartek 
      (MINERVA, MAGAF and ZE-KONP)/Government of the Basque Country/
PT  - Journal Article
DEP - 20230828
PL  - Switzerland
TA  - Sensors (Basel)
JT  - Sensors (Basel, Switzerland)
JID - 101204366
SB  - IM
PMC - PMC10490706
OTO - NOTNLM
OT  - annealing
OT  - domain wall propagation
OT  - giant magnetoimpedance
OT  - hysteresis loop
OT  - magnetic anisotropy
OT  - magnetic microwires
COIS- The authors declare no conflict of interest.
EDAT- 2023/09/09 11:43
MHDA- 2023/09/09 11:44
PMCR- 2023/08/28
CRDT- 2023/09/09 01:23
PHST- 2023/07/31 00:00 [received]
PHST- 2023/08/18 00:00 [revised]
PHST- 2023/08/26 00:00 [accepted]
PHST- 2023/09/09 11:44 [medline]
PHST- 2023/09/09 11:43 [pubmed]
PHST- 2023/09/09 01:23 [entrez]
PHST- 2023/08/28 00:00 [pmc-release]
AID - s23177481 [pii]
AID - sensors-23-07481 [pii]
AID - 10.3390/s23177481 [doi]
PST - epublish
SO  - Sensors (Basel). 2023 Aug 28;23(17):7481. doi: 10.3390/s23177481.